Chip-scale metalens microscope for wide-field and depth-of-field imaging

Microscopy is very important in research and industry, yet traditional optical microscopy suffers from the limited field-of-view (FOV) depth-of-field (DOF) high-resolution imaging. We demonstrate a simultaneous large FOV DOF microscope imaging technology based on chip-scale metalens device that implemented by SiNx array with co- cross-polarization multiplexed dual-phase design dispersive spectrum zoom effect. A 4-mm × obtained resolution of 1.74 μm 200 within wavelength range 450 to 510 nm, which definitely exceeds performance microscopes same resolution. Moreover, it realized miniaturized compact prototype, showing an overall advantage for portable convenient technology.